TFG6700 Series

TFG6700 Series Function/Arbitrary Waveform Generators can generate up to 60 MHz Sine signal, with 625 MSa/s sample rate and 16 bits vertical resolution, it can output high quality electronic signal close to reality. 166 kinds of waveforms can meet most experiment requirement. Optional TCXO and power amplifier is available if users need higher accuracy measurement.

 Contact Sales for Project Support

Applications

Research & Development (R&D)

This is the primary domain of the AWG, where engineers design and validate new products.

Communications System Design:

Modulation Testing: Generate complex modulated signals (PSK, FSK, NPSK, ASK, etc.) used in WiFi, 5G, satellite, and radar systems to test receiver algorithms and performance.

Bit Error Rate Testing (BERT): Create data streams with known patterns and introduce controlled distortions (jitter, noise, intersymbol interference) to measure a receiver's sensitivity and error correction capabilities.

Protocol Emulation: Generate signals that mimic specific communication protocols (like CAN, LIN, FlexRay in automotive) to test bus controllers and network devices before the rest of the system is built.

Semiconductor & Integrated Circuit (IC) Testing:

Stress Testing: Create signals with extreme voltage spikes, slow rise times, or noise to push a device beyond its normal operating conditions and find its failure points.

Power Electronics: Generate complex Pulse-Width Modulation (PWM) signals with dead-time control to test motor drives, inverter circuits, and switch-mode power supplies.

Sensor Simulation: Generate the precise, often non-linear, output signal of a sensor (e.g., a pressure transducer, thermocouple, or accelerometer) so that the sensor interface circuitry can be developed and tested independently.

Aerospace & Defense:

Radar Signal Simulation: Create pulsed signals with specific chirps, pulse widths, and repetition rates to test radar receivers and signal processors.

Sonar & Ultrasound: Generate the precise acoustic pulse shapes needed for sonar arrays and medical ultrasound imaging systems.

Electronic Warfare (EW): Emulate threat signals and jamming scenarios to test the resilience of friendly communication and detection systems.

Manufacturing Test (Production Line) 

In manufacturing, the goal is to verify a product's functionality quickly and reliably. 

Stimulus-Response Testing: The AWG provides a known, often complex, input signal to a Device Under Test (DUT). The DUT's output is then measured (e.g., by an oscilloscope or spectrum analyzer) and compared against a "golden" standard. If the response is within tolerance, the unit passes.

Fault Insertion: Intentionally generate "bad" signals—like a missing pulse, a glitch, or an out-of-spec voltage—to verify that the DUT's error-detection and safety mechanisms work correctly.

Education 

In university labs, AWGs are invaluable teaching tools. 

Demonstrating Theoretical Concepts: Students can see and measure the effects of concepts like Fourier series (building a square wave from sine waves), modulation, filter responses, and noise.

Capstone Design Projects: Student teams use AWGs to provide the control signals or simulated sensor data for their robotics, communications, or embedded systems projects.

Service & Repair 

Technicians can use AWGs to troubleshoot faulty systems. 

Signal Substitution: If a signal is missing in a complex system (e.g., an industrial controller), a technician can use an AWG to replicate that signal based on the system's documentation, injecting it to isolate the faulty module.

Technical Advantages for Engineers

Broad Frequency Coverage with High Sample Rate: Supporting output frequencies up to 60 MHz and a 625 MSa/s sampling rate, the TFG6700 series delivers detailed waveform reconstruction and extends its usability across a wide range of test conditions.

Extensive Waveform Library and Custom Signals: Engineers can leverage a large built‑in waveform library (166 types) and define custom arbitrary waveforms to simulate complex signal conditions representative of real‑world operating environments.

Dual Channel Output for Synchronous Testing: With two independent channels, the series supports correlated signal generation and phase‑aligned testing, useful for multi‑signal systems and cross‑channel verification workflows.

Modulation and Sweep Capabilities: TFG6700 series supports multiple modulation schemes, sweep operations, and burst modes, enabling comprehensive signal stimulus for modulation/demodulation tests and system stress testing.

How It Works

Connect the TFG6700 to the test system and configure channels based on DUT requirements.

Select or define the waveform type and set frequency, amplitude, and offset parameters for each output.

Enable modulation or sweep functions where dynamic signal changes are required for system verification.

Run tests and monitor output waveforms using an oscilloscope or measurement instrument to validate response and performance.